| 초록 |
Adhesion of the organic/inorganic interface is an important process in the field of assembly of devices, and thus adhesion has been widely studied by various researchers. Research on the detachment of organic/inorganic interfaces is equally important, especially in flexible devices. This work highlights the use of reduced graphene oxide (rGO) and manganese oxide (MnO) hybrid materials as a debonding layer for the fabrication of TFTs. We present a new debonding method, called ‘gas-induced debonding’ (GID), where rGO acts to reduce the adhesion between the PI and carrier glass, and the debonding is promoted by means of gas generated at the interface between PI and the glass, resulting from the catalytic reaction of Mn atoms with hydrogen peroxide (H2O2). We anticipate that the GID method will be a breakthrough in the area of rapid and damage-free separation of polymer films and substrates and can be generalized for developing DBLs for general flexible display applications. |
