화학공학소재연구정보센터
학회 한국재료학회
학술대회 2019년 봄 (05/15 ~ 05/17, 평창 알펜시아 리조트)
권호 25권 1호
발표분야 A. 전자/반도체 재료 분과
제목 Study of the structural analysis of Ag/Sn/Ag backside metal of high-temperature material semiconductor device
초록 Die bonding materials of the semiconductor manufacturing process should have a melting point higher than the temperature of the wire bonding process. Conventional Au-based alloys are very expensive and Pb-based alloys are toxic. Therefore, they should be replaced with a low-cost and eco-friendly materials. In this study, we report a die attach process using backside metals with Ag/Sn/Ag sandwich structure. It has a low-temperature bonding process and rapid bonding. After die attach process, we investigated the interfacial structure by optical microscope and electron microscopes.
저자 최여진1, 최진석1, 남상열2, 안성진1
소속 1금오공과대, 2구미전자정보기술원
키워드 backside metallization; die attach process; Sn-Ag
E-Mail