| 학회 |
한국고분자학회 |
| 학술대회 |
2007년 가을 (10/11 ~ 10/12, 일산킨텍스) |
| 권호 |
32권 2호 |
| 발표분야 |
분자전자 소재 및 소자 기술(분자전자 부문위원회) |
| 제목 |
Electric and luminance properties of degraded phosphorescent OLEDs. |
| 초록 |
Degradation process of a phosphorescent OLED was investigated by analyzing the transient electroluminescence (EL) of the device and photoluminescence characteristics of the consisting materials. As the degradation of the device proceeds under operation, the delayed component in transient EL decay was extended and the frequency response about electric pulse did not show significant change. This indicates that the degradation is related to the generation of charge traps with deep energy levels. Moreover, the degradation is not limited only to the emitting layer but extends to nearby hole transporting and hole blocking layers as observed by the reduction of photoluminescence efficiency of the layers with operation time. |
| 저자 |
정원익, 김장주
|
| 소속 |
서울대 |
| 키워드 |
degradation; OLEDs; phosphorescence; lifetime
|
| E-Mail |
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