| 학회 |
한국재료학회 |
| 학술대회 |
2017년 봄 (05/17 ~ 05/19, 목포 현대호텔) |
| 권호 |
23권 1호 |
| 발표분야 |
A. 전자/반도체 재료 분과 |
| 제목 |
Effect of Surface Morphology on the Ferromagnetic Resonance Line-width of Yttrium Iron Garnet Films |
| 초록 |
In this study, we have investigated the ferromagnetic resonance line-width of yttrium iron garnet (Y3Fe5O12, YIG) thin films prepared on {111} Gd3Ga5O12 (GGG) substrates by rf sputtering deposition. X-ray diffraction and transmission electron microscopy indicate that the YIG films are epitaxial films with high crystallinity and lattice matching with the substrate. Ferromagnetic resonance result demonstrated that YIG films have narrow resonance linewidth (ΔH) of which minimum value is 2.3 Oe. Thickness dependent of linewidth showed the optimized thickness for currently growing condition is 60 nm. The behavior of in-plane ΔH corresponding to two thickness ranges (t ＜ 60 nm and t ＞ 60 nm) was explained by surface roughness, two-magnon scattering and inhomogeneities on the surface of YIG films. Atomic force microscopy result showed the surface roughness of the film range in 0.18-1.36 nm and linearly depends on annealing temperature varied from 750-1000 oC in an oxygen atmosphere. |
| 저자 |
Phuoc CAOVAN1, Viet Dongquoc2, Srivathsava Surabhi1, Jong-Ryul Jeong2
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| 소속 |
1Department of Materials Science and Engineering, 2Chungnam National Univ. |
| 키워드 |
Ferromagnetic resonance; magnetic damping; sputtering; YIG
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| E-Mail |
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