화학공학소재연구정보센터
학회 한국재료학회
학술대회 2008년 가을 (11/07 ~ 11/07, 차세대융합기술연구원)
권호 14권 2호
발표분야 전자재료
제목 X선 조사에 의해 (Ba,Sr)FBr:Eu 형광 물질에 생성되는 결함 특성
초록 The mechanical property of the phosphore layer is investigated by the resolution(LP/mm), positron annihilation spectroscopy, and SEM. The image plate samples containing the phosphore layer were irradiated by X-rays in hospital many times and were used for the various years. The LP/mm values of the (Ba,Sr)FBr:Eu image plate irradiated by X-rays, varied between 2.2 and 2.0 for the 4 years. The purpose of Coincidence Doppler Broadening (CDB) positron annihilation spectroscopy is to analyze defect structure. The S parameters of the samples from hospital use varied from 0.6219 to 0.6232. There was a positive relationship between time of exposure to X-rays and the S parameters. Most of the defects were indicated to have been generated by X-rays.  
저자 신중기1, 이종용1, 권준현2
소속 1한남대, 2한국원자력(연)
키워드 (Ba; Sr)FBr:Eu; image plate; Phosphor; S parameters defect
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