| 초록 |
Copper phthalocyanine (CuPc)/fullerene (C60) based small molecular planar heterojunction photovoltaic cells show photo-degradation characteristics under light of illumination during very short time range in nitrogen environment. In this study, we focused on the interface between indium tin oxide (ITO) and CuPc in order to reveal the origin of photo-degradation of the devices. To modify the characteristics of the interface, the hole-extraction material was inserted as buffer layer. In the device with molybdenum oxide (MoO3) buffer layer, the series resistance did not increase under illumination of light and the device showed the higher photo-stability than reference device. By investigation of J-V characteristics of the hole-only devices, we concluded that high hole-extraction ability is needed for high photo-stability. It indicates that the characteristics of the interface between ITO and CuPc and the properties of the hole-extracting layer are important factor of photo-stability. |
