| 초록 |
Microstructure of electroplated layers is very important to improve various properties such as corrosion, wear resistances and other electro-magnetic properties. The conventional nucleation and growth mechanisms to make microstructure based on thermodynamics can not directly used because of an electrical field during electroplating. In this study, the models related to microstructure development of electroplated layers are introduced. Pro and con of defects analysis methods using various electron beam techniques and a new neutron beam method will be presented with experimental data of various electroplated layers like hexavalent and trivalent chromium for automobile industries, nickel for display parts and copper for electronic devices. |
