| 초록 |
Mechanical buckling usually means catastrophic failure in structural mechanics systems. Since the seminary work by Whitesides et. al.(Nature, 1998), however, controlled buckling of thin films on compliant substrates have been used to advantage in diverse fields such as micro/nano fabrication, optics, bio engineering, and metrology as well as the fundamental mechanics studies. Here, buckling-based metrology for thin films will be introduced first, followed by stretchable electronics applications. For the mechanical modulus measurements by the buckling method, various organic electronic materials are shown to be characterized by the method. Further, the comparison between buckling method and micro-tensile test for the modulus of composite materials will be presented and discussed. Finally, a high performance stretchable electronics using buckled single crystal Si ribbons on elastomeric substrate will be presented, including basic mechanics, fabrication, and electrical measurements. |
