| 학회 |
한국고분자학회 |
| 학술대회 |
2006년 봄 (04/06 ~ 04/07, 일산킨텍스) |
| 권호 |
31권 1호 |
| 발표분야 |
고분자 구조 및 물성 |
| 제목 |
Dependence of Surface Crystal Orientation on the Sample Thickness of PTN Thin Film |
| 초록 |
The surface segmental and crystal orientations of cold-crystallized poly(trimethylene 2,6-naphthalate) films of various thickness ranging from 45nm to 700nm have been studied using polarized FTIR-ATR and 2D GIXRD methods. For all samples studied, the 2D GIXRD profiles showed anisotropic orientation and this crystal orientation was dependent on sample thickness. The FTIR-ATR spectra also showed anisotropic orientation and those results are consistent with the 2D GIXRD results. The effect of sample thickness on the chain orientation was interpreted in terms of the different role of two surfaces (air and subtract) and crystalline growth mechanisim. |
| 저자 |
양영일1, 정미주1, 김영호2, 이한섭1
|
| 소속 |
1인하대, 2숭실대 |
| 키워드 |
surface; orientation; PTN
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| E-Mail |
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