| 학회 | 한국고분자학회 |
| 학술대회 | 2002년 봄 (04/12 ~ 04/13, 서울대학교) |
| 권호 | 27권 1호, p.137 |
| 발표분야 | 고분자 구조 및 물성 |
| 제목 | Dielectric Constants and Dielectric Behaviors of High Temperature Polyimide Thin Films |
| 초록 | Poly(amic acid)[PAA] precursors of three different polyimides with various backbone structures were synthesized and thermally converted to polyimides in thin films: PMDA-4,4’ODA, BPDA-4,4’ODA and 6FDA-4,4’ODA. For the polyimide films, the dielectric constants were investigated by using the capacitance and optical methods. At humid environment, the dielectric behaviors were studied by capacitance method and then compared with the water diffusion behaviors measured by gravimetric method. In addition, their morphological structures were examined by X-ray diffraction. For each different polyimide, dielectric constant are quite different, strongly depending upon the chemical and morphological structures and was in the decreasing order BPDA-4,4'ODA > PMDA-4,4'ODA > 6FDA-4,4'ODA. The degree of dielectric variation by absorbing water varies from 0.49 to 1.01, and is in the increasing order: BPDA-4,4'ODA < 6FDA-4,4'ODA < PMDA-4,4'ODA. It is closely related to the amount of absorbing water. According to absorbing water, the dielectric behavior in all the polyimide thin films well fitted to the Fickian diffusion model and their kinetics is closely related to the water diffusion kinetics. The dielectric variation coefficients in films vary in the range of 4.8 × 10-10 cm2/sec to 7.2 × 10-10 cm2/sec, is in the increasing order: BPDA-4,4'ODA < PMDA-4,4'ODA < 6FDA-4,4'ODA. Acknowledgment : This work was supported by Center for Electronic Packaging Materials of KSEF |
| 저자 | 이춘근, 이상엽, 박형석, 한학수 |
| 소속 | 연세대 |
| 키워드 | |
