| 학회 |
한국고분자학회 |
| 학술대회 |
2004년 봄 (04/09 ~ 04/10, 고려대학교) |
| 권호 |
29권 1호, p.266 |
| 발표분야 |
고분자 구조 및 물성 |
| 제목 |
Analysis of Beam Damage of Polyethylene Film in the Environmental Scanning Electron Microscope |
| 초록 |
The environmental scanning microscopy(ESEM) allows samples to be imaged while maintaining a low pressure of gas in the sample chamber. This ability of the ESEM to directly image sample without the need of usual sample preparations. In the course of observing the surface of the sample, specimen damage from the electron beam poses a considerable problem in electron microscopy. This damage is particularly acute in ESEM. Water molecules ionized by electron beam as an imaging gas in the specimen chamber produce hydrogen and hydroxyl free radicals which attack the organic material of the sample. In this work to elucidate the beam damage, areas of polyethylene(PE) films were exposed to the electron beam at varying dose and exposure times under the dehydrating conditions and different imaging gases(water vapor or nitrogen). In other to investigate the beam damage, the chemical changes of the PE film due to the electron-beam irradiation were observed by using FT-IR. The most obvious chemical and physical changes occurred as a result of the electron beam exposure were the formation of volatile products and mass loss, the appearance of unsaturated structures, chain scission and cross-linking. In the presence of water, free-radical-initiated reactions led to hydrolysis and oxidation of PE. |
| 저자 |
조혜진1, 류주환2, 송시용1, 변두진1, 최길영1
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| 소속 |
1한국화학(연), 2충남대 |
| 키워드 |
Beam Damage; Polyethylene
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| E-Mail |
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