| 학회 |
한국고분자학회 |
| 학술대회 |
2009년 가을 (10/08 ~ 10/09, 광주과학기술원 오룡관) |
| 권호 |
34권 2호 |
| 발표분야 |
방사광을 이용한 고분자 나노소재 연구 |
| 제목 |
Detailed Analysis of Gyroid and HPL Structures in Diblock Copolymer Thin Films with Synchrotron Grazing Incidence X-ray Scattering |
| 초록 |
In this study, a grazing incidence X-ray scattering (GIXS) formula was derived for gyroid and HPL structures formed in thin films supported on substrates. We measured two-dimensional (2D) GIXS patterns for gyroid and HPL structures formed in polystyrene-b-polyisoprene (PS-b-PI) diblock copolymer nanometer-scaled thin films supported on silicon substrates, and conducted a quantitative analysis of the obtained 2D GIXS data with the scattering formula. This analysis provided details (lattice parameter, width of the PS phase, positional distortion factor, orientation and orientation distribution) of both the strucures developed in the diblock copolymer thin films that are not easily obtained using conventional techniques. Moreover, we were able to simulate complete and detailed 2D GIXS patterns with the determined structure parameters. |
| 저자 |
진상우1, 박혜웅2, 이택준1, 박삼대1, 김진철1, 김동민1, 정정운1, 노예철1, 안병철1, 권원상1, 김경태1, 김미희1, 고용기1, 장태현1, 이문호1
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| 소속 |
1포항공과대, 2포항공대 |
| 키워드 |
grazing incidence X-ray scattering; diblock copolymer thin film; gyroid structure; HPL structure; paracrystal lattice; lattice parameter; orientation; positional distortion
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| E-Mail |
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