| 초록 |
It has been widely known that the electrical properties of organic thin film transistors (OTFTs) strongly depend on the crystal structure and molecular orientation of the organic semiconducting layer. And the charge carrier transport in OTFT devices has been recognized to occur primarily in the first few molecular layers close to the gate dielectric layer. Therefore, structural and morphological studies from ultra-thin layers to multilayers can provide insight to the structure-property relationship. In this talk, tunable molecular orientation and crystalline structures of organic thin films caused by various alkyl end-substitutions and substrate deposition temperature will be discussed by using synchrotron X-ray techniques, and those characteristics will be correlated with the final charge mobility. Furthermore, a new measuring system for in-situ X-ray reflectivity and in-situ 2-D grazing incidence X-ray diffraction during organic thin film growth will be introduced. |
