| 학회 | 한국공업화학회 |
| 학술대회 | 2011년 가을 (11/02 ~ 11/04, 경원대학교) |
| 권호 | 15권 2호 |
| 발표분야 | 교육프로그램 |
| 제목 | Powder X-ray diffraction analysis using TOPAS |
| 초록 | TOPAS defines a new standard for profile and structure analysis by seamlessly integrating all currently employed profile fitting techniques as well as related applications. TOPAS is built around a general non-linear least squares system written specifically to integrate various types of powder diffraction. This includes the ability to refine on any number of powder patterns (laboratory and synchrotron X-ray, CW and TOF neutron data) as well as single crystal data sets simultaneously. Its outstanding and unique fundamental parameters approach, function minimization routines and structure determination capabilities are just a few examples of howTOPAS is at the leading edge in powder diffraction. Moreover, as a result of its unique analytical capabilities, TOPAS has become the industry standard for quantitative phase analysis in industrial areas such as the cement and mining industries. |
| 저자 | 박성균 |
| 소속 | 브루커바이오사이언시스코리아(주) |
| 키워드 | TOPAS |
