| 초록 |
The crystallization of thin polymer film depends on surface/interface properties, due to the fact that molecular chain motion is affected by the presence of the surface. In this work, we measured the ferroelectric properties, crystallinity, chain conformation and surface morphologies of one-dimensionally confined P(VDF-TrFE) thin films, annealed at elevated temperatures, from just below melting temperature up to 180oC. Crystallization at low temperature, i.e., below melting temperature, the confinement effect has been found to be negligible. Crystallization at high temperatures, however, lead to superior ferroelectric properties, compared to samples crystallized without confinement. Surprisingly, the film has remained ferroelectric even after crystallization at 180oC; crystallization at such high temperature without confinement has led to permanent extinction of ferroelectric properties. The confinement-induced retention of ferroelectricity in P(VDF-TrFE) thin films can expand processing temperature in the fabrication of non-volatile organic memory devices with those well-developed CMOS-compatible processes. |
