화학공학소재연구정보센터
학회 한국공업화학회
학술대회 2017년 가을 (11/08 ~ 11/10, 부산 벡스코(BEXCO))
권호 21권 2호
발표분야 나노_포스터
제목 The investigation of reflectance on the various silicon wires with high aspect ratio fabricated by electrochemical etching
초록 The nano- and micro-structures of silicon surfaces, known as black silicon, is a promising approach to eliminate surface reflection in photovoltaic devices without a conventional anti-reflection layer. This might lead to both increase in efficiency and reduction in the manufacturing costs of solar cells. The various silicon wires with high aspect ratio is fabricated by varying electrochemical etching conditions and depositing ZnO using atomic layer deposition (ALD) technique. The reflectance on the various silicon wires is investigated a range of visible light wavelength (from 300 to 800nm). As a result, we have observed the change of the reflectance with the shape of silicon wires, and fabricated the silicon wires with the reflectance of 10% below from 300 to 800nm wavelength. Additionally the micro-structures of silicon surfaces is fabricated at a low cost and simple process, and contributed to improvement of solar cell efficiency.
저자 조성우, 장환수, 박지연, 김기희
소속 대구경북과학기술원
키워드 electrochemical etching; black silicon; reflectance; silicon wire
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