| 학회 |
한국공업화학회 |
| 학술대회 |
2012년 봄 (05/09 ~ 05/11, 김대중컨벤션센터) |
| 권호 |
16권 1호 |
| 발표분야 |
교육프로그램 |
| 제목 |
TOPAS 소프트웨어를 이용한 파우더 X선 회절데이터의 분석 |
| 초록 |
DIFFRAC.TOPAS defines a new standard for profile and structure analysis by seamlessly integrating all currently employed profile fitting techniques as well as related applications. TOPAS is built around a general non-linear least squares system written specifically to integrate various types of powder diffraction and single crystal analyses. This includes the ability to refine on any number of powder patterns (laboratory and synchrotron X-ray, CW and TOF neutron data) as well as single crystal data sets simultaneously. TOPAS is generally appreci¬ated for the combination of its intuitive user interface and high scientific standards, making it the ideal tool for industrial routine applications up to cutting edge research. |
| 저자 |
박성균 |
| 소속 |
브루커바이오사이언시스코리아㈜ |
| 키워드 |
TOPAS; Rietveld; Powder XRD
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| E-Mail |
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