화학공학소재연구정보센터
학회 한국고분자학회
학술대회 2002년 가을 (10/11 ~ 10/12, 군산대학교)
권호 27권 2호, p.332
발표분야 분자전자 부문위원회
제목 Control of Film Thickness in Nanometer Scale Using a Spin-cast Method
초록 Thin films have been widely used for many electronic and optical applications. The film thickness is one of the important parameters, which influences material properties. So, our present work is to find a method for the preparation of ulltrathin polymer films for the application of optical lithography. The films were prepared from the solutions of poly(BPMA-PLMA-MMA), PMMA and poly(vinyl alcohol) blended with photosensitive materials on Si substrates by using a spin casting method. The solvents were PGMEA, cyclohexanone, and 1-methoxy-2-propanol. The effects of solvents on the film uniformity were investigated. The film thickness was measured by ellipsometry, and the morphology of film surface was characterized using an atomic force microscope.
저자 최완식1, 김응렬2, 이해원, 한신호*
소속 1한양대, 2*한국산업기술대
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