| 초록 |
The physical and electronic properties of graphene film vary with its number of layers significantly, and thus the rapid and accurate estimation of the number of graphene layers is a prerequisite for practical applications as well as for fundamental studies. To date many efforts have been devoted to this issue and several methods based on transmission electron microscopy, atomic force microscopy, Raman spectroscopy, optical techniques, etc., are now available. However, they have certain drawbacks and limitations when used alone. By combining more than two existing methods, these weaknesses are expected to be resolved. In this study, we compare four methods, the 2D-to-G band peak ratio and the 2D peak shape change by Raman spectroscopy, the thickness measurement by atomic force microscope and the relative luminance measurement by optical microscope, and the correlation between the data obtained by four methods is analyzed. Based on the results, we discuss which methods produce a consistent result and which combination of four methods can provide an accurate and reliable result. |
