| 학회 | 한국재료학회 |
| 학술대회 | 2004년 봄 (05/14 ~ 05/14, 강릉대학교) |
| 권호 | 10권 1호 |
| 발표분야 | 기타 |
| 제목 | Ni 박막의 열처리 온도에 따른 자기광 특성 |
| 초록 | Thin magnetic films attract considerable interest of researchers in the connection of different devices of spin microelectronics. In this report we present the results on the investigation of magnetostatic properties of as-cast and annealed at 300, 400 and 500 oC nickel films. The Ni films were deposited on glass substrates at the room temperature by DC magnetron sputtering under a base pressure of less than 10-8 Torr and an argon gas pressure of 1x10-3 Torr. The film thickness was varied from 50 to 200 nm. The measurements of hysteresis loops were carried out employing both magneto-optical magnetometer and VSM. Spectral dependencies of the Transverse Kerr Effect (TKE) were measured for the 1.37 - 6.2 eV energy range of the incident light by the magneto-optical spectrometer. The annealed at 400 and 500 oC films were found to be isotropic. The as-deposited and annealed at 300oC films were discovered to exhibit an in-plane easy axis of magnetization (EAM). Hysteresis loops along EAM have nearly rectangular shape (the reduced remanent magnetization is about 0.96). The strong influence of annealing temperature on magnetic properties of the films was discovered. In particular, for the annealed at 400 and 500 oC Ni film with 200-nm thickness, the near-surface value of HC is equal to 120 Oe that is larger (about 4 times) in comparison with the as-cast sample. The observed variations of the magnetic properties as functions of the thickness and annealing temperature were explained by structural changes of the Ni films. The discovered marked distinction of the near-surface and volume magnetic characteristics of the Ni films was ascribed to the roughness existing at the film surface. Whit increasing the annealing temperature, Tann, the magnetooptical spectra of the films were revealed to change insignificantly. The decrease of magneto-optical signal with enlarging Tann was explained by the change of electronic structure of the films. |
| 저자 | 서정화, 김철기, 김종오, 김란 |
| 소속 | 충남대 |
| 키워드 | thin films; MO |
