학회 |
한국고분자학회 |
학술대회 |
2007년 가을 (10/11 ~ 10/12, 일산킨텍스) |
권호 |
32권 2호 |
발표분야 |
나노구조제어 및 분석기술 |
제목 |
Recovery of Remanent Polarization of Poly(vinylidene fluoride-co-trifluoroethylene) Thin Film after High Temperature Annealing using Topographically Nanostructured Aluminium Bottom Electrode |
초록 |
Utilization of an etched Al bottom electrode, which has a topographic and periodic nanometer scale surface with hexagonal registry of the recessed hemi-spherical bowls of approximately 100 nm in diameter, significantly improved the high temperature stability of ferroelectric polarization in a capacitor containing poly(vinylidene fluoride-co-trifluoroethylene) (P(VDF-TrFE)) thin film. Fairly large remnant polarization of approximately 10µC/cm2 was maintained after annealing up to 185 oC with the etched Al electrode while drastic drop of the polarization was observed near the melting temperature of P(VDF-TrFE) (~150 oC) with a flat Al electrode. The heat treatment above 200 oC caused the polarization of both types of capacitors to become almost zero. The topographic electrode is found to facilitate the reorganization of P(VDF-TrFE) crystal under electric field. |
저자 |
박연정1, 강석주1, 우은택2, 신규순2, 박철민1
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소속 |
1연세대, 2서울대 |
키워드 |
ferroelectric polymer; topographic electrode
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E-Mail |
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