화학공학소재연구정보센터
학회 한국고분자학회
학술대회 2011년 가을 (10/06 ~ 10/07, 김대중 컨벤션센터)
권호 36권 2호
발표분야 고분자 구조 및 분석-Scattering & Spectroscopy
제목 Structural Characterization of Self-Assembled Organic Semiconducting Thin Films
초록 Organic semiconductors have been intensively studied in recent decades as potential alternatives to conventional inorganic semiconductors for low-cost, large-area, and flexible electronics applications. In the area of organic field-effect transistors (OFETs), π-conjugated assembly of organic semiconductors plays an important role in maximizing long-distance charge transfer. Depending on film processing conditions, crystalline structures on dielectric substrates are significantly changed, resulting in very different field-effect mobilities in OFET devices. Here, the crystalline structures of organic semiconducting films, which were fabricated by either vacuum- or solution-processing methods, were investigated by using grazing-incidence X-ray diffraction, as well as atomic force microscopy. Based on these analyses, we could successively correlate electric performance of the resulting OFET devices with the π-conjugated structures.
저자 양회창1, 백경열2
소속 1인하대, 2한국과학기술(연)
키워드 Grazing-incidence X-ray Diffraction; Scattering; Organic semiconductor
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