검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Combining Ellipsometry and AFM To Probe Subnanometric Precursor Film Dynamics of Polystyrene Melts Schune C, Yonger M, Bresson B, Fretigny C, Guy L, Chaussee T, Lequeux F, Montes H, Verneuil E Langmuir, 35(24), 7727, 2019 |
| No. | Article |
|---|---|
| 1 |
Combining Ellipsometry and AFM To Probe Subnanometric Precursor Film Dynamics of Polystyrene Melts Schune C, Yonger M, Bresson B, Fretigny C, Guy L, Chaussee T, Lequeux F, Montes H, Verneuil E Langmuir, 35(24), 7727, 2019 |