| 1 |
Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy
Zemek J, Houdkova J, Jiricek P, Izak T, Kalbac M
Applied Surface Science, 491, 16, 2019 |
| 2 |
Determining the thickness of aliphatic alcohol monolayers covalently attached to silicon oxide surfaces using angle-resolved X-ray photoelectron spectroscopy
Lee AWH, Kim D, Gates BD
Applied Surface Science, 436, 907, 2018 |
| 3 |
Atomic configurations in AP-MOVPE grown lattice-mismatched InGaAsN films unravelled by X-ray photoelectron spectroscopy combined with bulk and surface characterization techniques
Lopez-Escalante MC, Sciana B, Dawidowski W, Bielak K, Gabas M
Applied Surface Science, 433, 1, 2018 |
| 4 |
Surface oxidation of SnTe topological crystalline insulator
Berchenko N, Vitchev R, Trzyna M, Wojnarowska-Nowak R, Szczerbakow A, Badyla A, Cebulski J, Story T
Applied Surface Science, 452, 134, 2018 |
| 5 |
Sub-nanometer resolution XPS depth profiling: Sensing of atoms
Szklarczyk M, Macak K, Roberts AJ, Takahashi K, Hutton S, Glaszczka R, Blomfield C
Applied Surface Science, 411, 386, 2017 |
| 6 |
Interface and stability analysis of Tantalum- and Titanium nitride thin films onto Lithiumniobate
Vogel U, Oswald S, Eckert J
Applied Surface Science, 425, 254, 2017 |
| 7 |
Differences between GaAs/GaInP and GaAs/AlInP interfaces grown by movpe revealed by depth profiling and angle-resolved X-ray photoelectron spectroscopies
Lopez-Escalante MC, Gabas M, Garcia I, Barrigon E, Rey-Stolle I, Algora C, Palanco S, Ramos-Barrado JR
Applied Surface Science, 360, 477, 2016 |
| 8 |
Aspects of native oxides etching on n-GaSb(100) surface
Cotirlan C, Ghita RV, Negrila CC, Logofatu C, Frumosu F, Lungu GA
Applied Surface Science, 363, 83, 2016 |
| 9 |
A variable density model for the interpretation of ARXPS data
Paynter RW, Chanbi Z
Applied Surface Science, 255(5), 2746, 2008 |
| 10 |
Formation of high-density Si nanodots by agglomeration of ultra-thin amorphous Si films
Kondo H, Ueyama T, Ikenaga E, Kobayashi K, Sakai A, Ogawa M, Zaima S
Thin Solid Films, 517(1), 297, 2008 |
