검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
SILC decay in La2O3 gate dielectrics grown on Ge substrates subjected to constant voltage stress Rahman MS, Evangelou EK, Androulidakis II, Dimoulas A, Mavrou G, Galata S Solid-State Electronics, 54(9), 979, 2010 |
| 2 |
Structural and electrical properties of HfO2/Dy2O3 gate stacks on Ge substrates Evangelou EK, Rahman MS, Androulidakis II, Dimoulas A, Mavrou G, Giannakopoulos KP, Anagnostopoulos DF, Valicu R, Borchert GL Thin Solid Films, 518(14), 3964, 2010 |
| 3 |
Current Transport Mechanism in High-kappa Cerium Oxide Gate Dielectrics Grown on Germanium Substrates Rahman MS, Evangelou EK, Androulidakis II, Dimoulas A Electrochemical and Solid State Letters, 12(5), H165, 2009 |
| 4 |
Investigation of voltage dependent relaxation, charge trapping, and stress induced leakage current effects in HfO2/Dy2O3 gate stacks grown on Ge (100) substrates Rahman MS, Evangelou EK, Androulidakis II, Dimoulas A, Mavrou G, Tsipas P Journal of Vacuum Science & Technology B, 27(1), 439, 2009 |