검색결과 : 14건
| No. | Article |
|---|---|
| 1 |
Dopant passivation and work function tuning through attachment of heterogeneous organic monolayers on silicon in ultrahigh vacuum Cooper AJ, Keyvanfar K, Deberardinis A, Pu L, Bean JC Applied Surface Science, 257(14), 6138, 2011 |
| 2 |
Vapor phase deposition of oligo(phenylene ethynylene) molecules for use in molecular electronic devices Gergel-Hackett N, Cabral MJ, Pernell TL, Harriott LR, Bean JC, Chen B, Lu M, Tour JM Journal of Vacuum Science & Technology B, 25(1), 252, 2007 |
| 3 |
Systematic studies of SiGe/Si islands nucleated via separate in situ or ex situ Ga+ focused ion beam-guided growth techniques Vandervelde TE, Atha S, Hull R, Pernell TL, Bean JC Journal of Vacuum Science & Technology A, 24(2), 375, 2006 |
| 4 |
Effects of molecular environments on the electrical switching with memory of nitro-containing OPEs Gergel-Hackett N, Majumdar N, Martin Z, Swami N, Harriott LR, Bean JC, Pattanaik G, Zangari G, Zhu Y, Pu I, Yao Y, Tour JM Journal of Vacuum Science & Technology A, 24(4), 1243, 2006 |
| 5 |
Study of the room temperature molecular memory observed from a nanowell device Gergel N, Majumdar N, Keyvanfar K, Swami N, Harriott LR, Bean JC, Pattanaik G, Zangari G, Yao Y, Tour JM Journal of Vacuum Science & Technology A, 23(4), 880, 2005 |
| 6 |
Nanowell device for the electrical characterization of metal-molecule-metal junctions Majumdar N, Gergel N, Routenberg D, Bean JC, Harriott LR, Li B, Pu L, Yao Y, Tour JM Journal of Vacuum Science & Technology B, 23(4), 1417, 2005 |
| 7 |
Induced crystallization as a nonlithographic pattern transfer technique for nanofabrication Cabral MJ, Lye WK, Bean JC, Reed ML, Chraska T, Mesarovic SD, Hull R, Phillips AB Journal of Vacuum Science & Technology B, 19(6), 2793, 2001 |
| 8 |
X-ray scattering studies of maquette peptide monolayers. 2. Interferometry at the vapor/solid interface Strzalka J, Chen XX, Moser CC, Dutton PL, Bean JC, Blasie JK Langmuir, 17(4), 1193, 2001 |
| 9 |
Tribochemical reactions of silicon : An in situ infrared spectroscopy characterization Muratov VA, Olsen JE, Gallois BM, Fischer TE, Bean JC Journal of the Electrochemical Society, 145(7), 2465, 1998 |
| 10 |
Extended-Spectral-Range Fourier-Transform Infrared-Attenuated Total-Reflection Spectroscopy on Si Surfaces Using a Novel Si Coated Ge Attenuated Total-Reflection Prism Rudkevich E, Savage DE, Cai W, Bean JC, Sullivan JS, Nayak S, Kuech TF, Mccaughan L, Lagally MG Journal of Vacuum Science & Technology A, 15(4), 2153, 1997 |