검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Secondary ion coincidence in highly charged ion based secondary ion mass spectroscopy for process characterization Hamza AV, Schenkel T, Barnes AV, Schneider DH Journal of Vacuum Science & Technology A, 17(1), 303, 1999 |
| 2 |
Analysis of B-SiO2 films by highly charged ion based time-of-flight secondary ion mass spectrometry, standard secondary ion mass spectrometry and elastic recoil detection Schenkel T, Hamza AV, Barnes AV, Schneider DH, Walsh DS, Doyle BL Journal of Vacuum Science & Technology A, 16(3), 1384, 1998 |
| 3 |
Electronic desorption of alkyl monolayers from silicon by very highly charged ions Schenkel T, Schneider M, Hattass M, Newman MW, Barnes AV, Hamza AV, Schneider DH, Cicero RL, Chidsey CED Journal of Vacuum Science & Technology B, 16(6), 3298, 1998 |
| 4 |
Free-Electron Laser Spectroscopy of Semiconductors and Interfaces Mckinley JT, Albridge RG, Barnes AV, Chen GC, Davidson JL, Languell ML, Polavarapu PL, Smith JF, Yang X, Ueda A, Tolk N, Coluzza C, Baudat PA, Dupuy C, Gozzo F, Iilegems M, Martin D, Moriergenoud F, Rudra A, Tuncel E, Margaritondo G Journal of Vacuum Science & Technology A, 12(4), 2323, 1994 |