검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Analysis of selectively grown epitaxial Si1-xGex by spectroscopic ellipsometry and comparison with other established techniques Loo R, Caymax M, Libezny M, Blavier G, Brijs B, Geenen L, Vandervorst W Journal of the Electrochemical Society, 147(2), 751, 2000 |