| 1 |
Stress analysis of stacked Si wafer in 3D WLP
Maeng KH, Kim Y, Kang SG, Kim SD, Kim SE
Current Applied Physics, 11(4), S119, 2011 |
| 2 |
Lattice parameter measurement in single crystalline LiCoO2 particles by convergent beam electron diffraction
Gabrisch H, Xing Q
Solid State Ionics, 179(37), 2104, 2008 |
| 3 |
Selected area and convergent-beam electron diffraction of LaGaO3 and LaGa0.9Mg0.1O2.95 - Space group determinations and identification of anti-phase domain structure
Ogata Y, Tsuda K, Yamaguchi M, Fumoto T, Furuya T, Hashimoto TU
Solid State Ionics, 178(15-18), 1113, 2007 |
| 4 |
Lithiation of ramsdellite-pyrolusite MnO2; NMR, XRD, TEM and electrochemical investigation of the discharge mechanism
Bowden W, Grey CP, Hackney S, Wang F, Paik Y, Iltchev N, Sirotina R
Journal of Power Sources, 153(2), 265, 2006 |
| 5 |
Internal stress field in ultrafine grained aluminium fabricated by accumulative roll-bonding
Ueji R, Taniguchi J, Sumida N, Tanaka K, Tsuji N
Materials Science Forum, 512, 123, 2006 |
| 6 |
Manganese distribution in ferromagnetic gallium manganese nitride epitaxial film grown by plasma enhanced molecular beam epitaxy
Chang JY, Kim GH, Lee WY, Myoung JM
Thin Solid Films, 472(1-2), 144, 2005 |
| 7 |
The effect of substrate polarity on the growth of InN by RF-MBE
Naoi H, Matsuda F, Araki T, Suzuki A, Nanishi Y
Journal of Crystal Growth, 269(1), 155, 2004 |
| 8 |
A study on interfacial reaction between electroless plated Ni-P/Au UBM and Sn-Bi eutectic solder using AEM
Choi JK, Kang HB, Lee JW, Jung SB, Yang CW
Materials Science Forum, 449-4, 405, 2004 |
| 9 |
CBED and LACBED analysis of stacking faults and antiphase boundaries
Morniroli JP
Materials Chemistry and Physics, 81(2-3), 209, 2003 |
| 10 |
The software tool for lattice parameters determination from nanoareas using CBED patterns
Paukowski P, Gigla M, Kostka A, Morawiec H
Materials Chemistry and Physics, 81(2-3), 233, 2003 |
