화학공학소재연구정보센터
검색결과 : 9건
No. Article
1 Electrochemical reversibility of vinylferrocene monolayers covalently attached on H-terminated p-Si(100)
Decker F, Cattaruzza F, Coluzza C, Flamini A, Marrani AG, Zanoni R, Dalchiele EA
Journal of Physical Chemistry B, 110(14), 7374, 2006
2 Evidence of domain formation in cardiolipin-glycerophospholipid mixed monolayers. A thermodynamic and AFM study
Sennato S, Bordi F, Cametti C, Coluzza C, Desideri A, Rufini S
Journal of Physical Chemistry B, 109(33), 15950, 2005
3 Atomic force microscopy characterization of the ageing of pure cellulose paper
Piantanida G, Bicchieri M, Coluzza C
Polymer, 46(26), 12313, 2005
4 Application of a segmentation algorithm to quantum dots study
Belardinelli P, Capoleoni S, Tirozzi B, Coluzza C
Journal of Vacuum Science & Technology B, 22(2), 588, 2004
5 Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films
Masetti E, Bulir J, Gagliardi S, Janicki V, Krasilnikova A, Di Santo G, Coluzza C
Thin Solid Films, 455-56, 468, 2004
6 A study of physical properties and gas-surface interaction of vanadium oxide thin films
Rella R, Siciliano P, Cricenti A, Generosi R, Girasole M, Vanzetti L, Anderle M, Coluzza C
Thin Solid Films, 349(1-2), 254, 1999
7 Pt-SnO2 Thin-Films for Gas Sensor Characterized by Atomic-Force Microscopy and X-Ray Photoemission Spectromicroscopy
Cricenti A, Generosi R, Scarselli MA, Perfetti P, Siciliano P, Serra A, Tepore A, Almeida J, Coluzza C, Margaritondo G
Journal of Vacuum Science & Technology B, 14(2), 1527, 1996
8 Laterally Resolved Measurements of Cesium Iodide Quantum Yield
Dellorto T, Almeida J, Coluzza C, Conforto E, Destasio G, Margaritondo G, Paic G, Braem A, Piuz F, Tonner BP
Journal of Vacuum Science & Technology A, 13(6), 2787, 1995
9 Free-Electron Laser Spectroscopy of Semiconductors and Interfaces
Mckinley JT, Albridge RG, Barnes AV, Chen GC, Davidson JL, Languell ML, Polavarapu PL, Smith JF, Yang X, Ueda A, Tolk N, Coluzza C, Baudat PA, Dupuy C, Gozzo F, Iilegems M, Martin D, Moriergenoud F, Rudra A, Tuncel E, Margaritondo G
Journal of Vacuum Science & Technology A, 12(4), 2323, 1994