검색결과 : 14건
| No. | Article |
|---|---|
| 1 |
Automated online measurement of limestone particle size distributions using 3D range data Thurley MJ Journal of Process Control, 21(2), 254, 2011 |
| 2 |
Delineation of defect structures in flux-grown GdFeO3 crystals by etching Kachroo SK, Bamzai KK, Dhar PR, Kotru PN, Wanklyn BM Applied Surface Science, 156(1-4), 149, 2000 |
| 3 |
Rapid delineation of humic and non-humic organic matter fractions in water Marhaba TF, Pu Y Journal of Hazardous Materials, 73(3), 221, 2000 |
| 4 |
Comparative study of two-dimensional junction profiling using a dopant selective etching method and the scanning capacitance spectroscopy method Mahaffy R, Shih CK, Edwards H Journal of Vacuum Science & Technology B, 18(1), 566, 2000 |
| 5 |
Quantitative two-dimensional profiling of 0.35 mu m transistors with lightly doped drain structures McDonald A, Mahaffy R, Wang XD, Kuklewicz C, Shih CK, Dennis M, Tiffin D, Kadoch D, Duane M Journal of Vacuum Science & Technology B, 18(1), 572, 2000 |
| 6 |
Two-dimensional profiling in silicon using conventional and electrochemical selective etching Trenkler T, Vandervorst W, Hellemans L Journal of Vacuum Science & Technology B, 16(1), 349, 1998 |
| 7 |
Two-dimensional pn-junction delineation and individual dopant identification using scanning tunneling microscopy/spectroscopy Chao KJ, Smith AR, McDonald AJ, Kwong DL, Streetman BG, Shih CK Journal of Vacuum Science & Technology B, 16(1), 453, 1998 |
| 8 |
Factors affecting two-dimensional dopant profiles obtained by transmission electron microscopy of etched p-n junctions in Si Neogi SS, Venables D, Na ZY, Maher DM Journal of Vacuum Science & Technology B, 16(1), 471, 1998 |
| 9 |
Strong effect of dopant concentration gradient an etching rate Ukraintsev VA, McGlothlin R, Gribelyuk MA, Edwards H Journal of Vacuum Science & Technology B, 16(1), 476, 1998 |
| 10 |
2-Dimensional Scanning Capacitance Microscopy Measurements of Cross-Sectioned Very Large-Scale Integration Test Structures Neubauer G, Erickson A, Williams CC, Kopanski JJ, Rodgers M, Adderton D Journal of Vacuum Science & Technology B, 14(1), 426, 1996 |