검색결과 : 2건
No. | Article |
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1 |
High-density, inductively coupled plasma etch of sub half-micron critical layers : Transistor polysilicon gate definition and contact formation Westerheim AC, Jones RD, Mager PJ, Dubash JH, Dalton TJ, Goss MW, Baum SK, Dass SK Journal of Vacuum Science & Technology B, 16(5), 2699, 1998 |
2 |
Substrate Bias Effects in High-Aspect-Ratio SiO2 Contact Etching Using an Inductively-Coupled Plasma Reactor Westerheim AC, Labun AH, Dubash JH, Arnold JC, Sawin HH, Yuwang V Journal of Vacuum Science & Technology A, 13(3), 853, 1995 |