화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 High-density, inductively coupled plasma etch of sub half-micron critical layers : Transistor polysilicon gate definition and contact formation
Westerheim AC, Jones RD, Mager PJ, Dubash JH, Dalton TJ, Goss MW, Baum SK, Dass SK
Journal of Vacuum Science & Technology B, 16(5), 2699, 1998
2 Substrate Bias Effects in High-Aspect-Ratio SiO2 Contact Etching Using an Inductively-Coupled Plasma Reactor
Westerheim AC, Labun AH, Dubash JH, Arnold JC, Sawin HH, Yuwang V
Journal of Vacuum Science & Technology A, 13(3), 853, 1995