검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Differentiation between electric breakdowns and dielectric breakdown in thin silicon oxides Jackson JC, Robinson T, Oralkan O, Dumin DJ, Brown GA Journal of the Electrochemical Society, 145(3), 1033, 1998 |
| 2 |
The search for cathode and anode traps in high-voltage stressed silicon oxides Chen L, Kang CS, Oralkan O, Dumin DJ, Brown GA, Bellutti P Journal of the Electrochemical Society, 145(4), 1292, 1998 |
| 3 |
Thickness Dependence of Oxide Wearout Dumin DJ Journal of the Electrochemical Society, 143(11), 3736, 1996 |
| 4 |
The Transient Nature of Excess Low-Level Leakage Currents in Thin Oxides Scott RS, Dumin DJ Journal of the Electrochemical Society, 142(2), 586, 1995 |
| 5 |
Traps in Reoxidized Nitrided Oxides of Varying Thicknesses Natarajan R, Dumin DJ Journal of the Electrochemical Society, 142(2), 645, 1995 |
| 6 |
Voltage and Fluence Dependence of Stress-Generated Traps Inside Thin Silicon-Oxide Scott RS, Subramonium R, Dumin DJ Journal of the Electrochemical Society, 142(3), 930, 1995 |
| 7 |
Wearout and Breakdown in Thin Silicon-Oxide Dumin DJ Journal of the Electrochemical Society, 142(4), 1272, 1995 |
| 8 |
Evidence for Nonuniform Trap Distributions in Thin Oxides After High-Voltage Stressing Dumin DJ, Vanchinathan S, Mopuri S, Subramoniam R Journal of the Electrochemical Society, 142(6), 2055, 1995 |
| 9 |
Characterizing Wearout, Breakdown, and Trap Generation in Thin Silicon-Oxide Dumin DJ, Maddux JR, Subramoniam R, Scott RS, Vanchinathan S, Dumin NA, Dickerson KJ, Mopuri S, Gladstone SM, Hughes TW Journal of Vacuum Science & Technology B, 13(4), 1780, 1995 |