화학공학소재연구정보센터
검색결과 : 25건
No. Article
1 ZnO/Carbon xerogel photocatalysts by low-pressure plasma treatment, the role of the carbon substrate and its plasma functionalization
Haye E, Job N, Wang YY, Penninckx S, Stergiopoulos V, Tumanov N, Cardinal M, Busby Y, Colomer JF, Su BL, Pireaux JJ, Houssiau L
Journal of Colloid and Interface Science, 570, 312, 2020
2 Interaction of phosphorylcholine with fibronectin coatings: Surface characterization and biological performances
Montano-Machado V, Noel C, Chevallier P, Turgeon S, Houssiau L, Pauthe E, Pireaux JJ, Mantovani D
Applied Surface Science, 396, 1613, 2017
3 Surface functionalization of cyclic olefin copolymer (COC) with evaporated TiO2 thin film
El Fissi L, Vandormael D, Houssiau L, Francis LA
Applied Surface Science, 363, 670, 2016
4 Cesium redeposition artifacts during low energy ToF-SIMS depth profiling
Vitchev RG, Brison J, Houssiau L
Applied Surface Science, 255(17), 7586, 2009
5 The Storing Matter technique: Preliminary results on PS and PVC
Philipp P, Douhard B, Lacour F, Wirtz T, Houssiau L, Pireaux JJ, Migeon HN
Applied Surface Science, 255(4), 866, 2008
6 Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement
Heile A, Lipinsky D, Wehbe N, Delcorte A, Bertrand P, Felten A, Houssiau L, Pireaux JJ, De Mondt R, Van Vaeck L, Arlinghaus HF
Applied Surface Science, 255(4), 941, 2008
7 Molecular depth profiling of polymers with very low energy ions
Houssiau L, Douhard B, Mine N
Applied Surface Science, 255(4), 970, 2008
8 MCsn+ cluster formation on organic surfaces: A novel way to depth-profile organics?
Mine N, Douhard B, Houssiau L
Applied Surface Science, 255(4), 973, 2008
9 Depth distribution of Cs implanted into Si at steady-state during dual beam ToF-SIMS profiling
Vitchev RG, Brison J, Houssiau L
Applied Surface Science, 255(4), 1331, 2008
10 The Storing Matter technique: Application to inorganic samples
Philipp P, Lacour F, Wirtz T, Houssiau L, Pireaux JJ, Migeon HN
Applied Surface Science, 255(4), 1501, 2008