검색결과 : 3건
No. | Article |
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1 |
Analysis of interface layers by spectroscopic ellipsometry Kim TJ, Yoon JJ, Kim YD, Aspnes DE, Klein MV, Ko DS, Kim YW, Elarde VC, Coleman JJ Applied Surface Science, 255(3), 640, 2008 |
2 |
Analysis of ellipsometric and photoemission spectra of diluted magnetic semiconductors by hybridization interaction mechanism Kim YD, Chang YC, Klein MV Thin Solid Films, 313-314, 183, 1998 |
3 |
Evolution of Magnetic and Superconducting Fluctuations with Doping of High-T-C Superconductors Blumberg G, Kang MS, Klein MV, Kadowaki K, Kendziora C Science, 278(5342), 1427, 1997 |