화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Analysis of interface layers by spectroscopic ellipsometry
Kim TJ, Yoon JJ, Kim YD, Aspnes DE, Klein MV, Ko DS, Kim YW, Elarde VC, Coleman JJ
Applied Surface Science, 255(3), 640, 2008
2 Analysis of ellipsometric and photoemission spectra of diluted magnetic semiconductors by hybridization interaction mechanism
Kim YD, Chang YC, Klein MV
Thin Solid Films, 313-314, 183, 1998
3 Evolution of Magnetic and Superconducting Fluctuations with Doping of High-T-C Superconductors
Blumberg G, Kang MS, Klein MV, Kadowaki K, Kendziora C
Science, 278(5342), 1427, 1997