1 |
Conductivity and distribution of charge on electroluminescent Si/SiO2 structures investigated by electrostatic force microscopy Suominen T, Paturi P, Huhtinen H, Heikkila L, Hedman HP, Punkkinen R, Laiho R Applied Surface Science, 222(1-4), 131, 2004 |
2 |
Influence of thermal scanning and local inhomogeneity on the shape of AC susceptibility curves of high-T-C superconductors Bodi AC, Laiho R, Lahderanta E, Raittila J Thermochimica Acta, 406(1-2), 143, 2003 |
3 |
Growth of (111)-oriented PbTe films on Si(001) using a BaF2 buffer Belenchuk A, Fedorov A, Huhtinen H, Kantser V, Laiho R, Shapoval O, Zakhvalinskii V Thin Solid Films, 358(1-2), 277, 2000 |
4 |
Structural investigation of hydrous TiO2 precipitates and their aging products by X-ray diffraction, atomic force microscopy, and transmission electron microscopy Jalava JP, Heikkila L, Hovi O, Laiho R, Hiltunen E, Hakanen A, Harma H Industrial & Engineering Chemistry Research, 37(4), 1317, 1998 |
5 |
Observation of the Photovoltaic and Related Effects in Porous Silicon by Scanning-Tunneling-Microscopy Laiho R, Pavlov A, Pavlova Y Thin Solid Films, 297(1-2), 138, 1997 |
6 |
UV (H-Nu=8.43 eV) Photoelectron-Spectroscopy of Porous Silicon Near Fermi-Level Aprelev AM, Lisachenko AA, Laiho R, Pavlov A, Pavlova Y Thin Solid Films, 297(1-2), 142, 1997 |
7 |
Photoluminescence of Laser-Deposited Porous Silicon and Its Correlation with Density of Electronic States Determined by Scanning-Tunneling-Microscopy Laiho R, Pavlov A Thin Solid Films, 276(1-2), 279, 1996 |
8 |
Preparation of Porous Silicon Films by Laser-Ablation Laiho R, Pavlov A Thin Solid Films, 255(1-2), 9, 1995 |
9 |
Temperature-Dependence of Radiative and Nonradiative-Transitions in Porous Silicon Tsuboi T, Laiho R, Pavlov A Thin Solid Films, 255(1-2), 216, 1995 |
10 |
Electronic-Properties and Schottky-Barrier of the Porous Silicon - Au Interface Laiho R, Pavlov A Thin Solid Films, 255(1-2), 276, 1995 |