검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Hot-carrier aging of NMOST in analog circuits with large periodic drain signal Habas P Solid-State Electronics, 50(5), 727, 2006 |
| 2 |
Low-Field Trap Generation Dependence on the Injection Current-Density in Gate Insulators - How Valid Are Accelerated Hot-Electron Measurements Kim HS, Reisman A, Williams CK Journal of the Electrochemical Society, 144(7), 2517, 1997 |