검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry Petrik P, Gumprecht T, Nutsch A, Roeder G, Lemberger M, Juhasz G, Polgar O, Major C, Kozma P, Janosov M, Fodor B, Agocs E, Fried M Thin Solid Films, 541, 131, 2013 |
| 2 |
Expanded beam (macro-imaging) ellipsometry Fried M, Juhasz G, Major C, Petrik P, Polgar O, Horvath Z, Nutsch A Thin Solid Films, 519(9), 2730, 2011 |
| 3 |
Optical and electrical characterization of aluminium doped ZnO layers Major C, Nemeth A, Radnoczi G, Czigany Z, Fried M, Labadi Z, Barsony I Applied Surface Science, 255(21), 8907, 2009 |
| 4 |
Growth and characterization of GaAs layers on polished Ge/Si by selective aspect ratio trapping Li JZ, Bai J, Hydrick JM, Park JS, Major C, Carroll M, Fiorenza JG, Lochtefeld A Journal of Crystal Growth, 311(11), 3133, 2009 |
| 5 |
Spectroscopic ellipsornetry study of transparent conductive ZnO layers for CIGS solar cell applications Nemeth A, Major C, Fried M, Labadi Z, Barsony I Thin Solid Films, 516(20), 7016, 2008 |
| 6 |
Reduced-pressure chemical vapor deposition of epitaxial ge films on si(001) substrates using GeCl4 Park JS, Curtin M, Major C, Bengtson S, Carroll M, Lochtefeld A Electrochemical and Solid State Letters, 10(11), H313, 2007 |