검색결과 : 18건
No. | Article |
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1 |
Reactive co-deposition of TiNx/SiNx nanocomposites using pulsed direct current magnetron sputtering Sunal P, Messier R, Horn MW Thin Solid Films, 515(4), 2185, 2006 |
2 |
Deposition of c-BN on silicon substrates coated with diamond thin films He Q, Li CM, Frankel C, Pilione L, Drawl B, Lu FX, Messier R Thin Solid Films, 474(1-2), 96, 2005 |
3 |
Selective growth of sculptured nanowires on microlithographic lattices Horn MW, Pickett MD, Messier R, Lakhtakia A Journal of Vacuum Science & Technology B, 22(6), 3426, 2004 |
4 |
Analysis of the optical properties and structure of sculptured thin films from spectroscopic Mueller matrix ellipsometry Podraza NJ, Chen C, An I, Ferreira GM, Rovira PI, Messier R, Collins RW Thin Solid Films, 455-56, 571, 2004 |
5 |
Characterization of cubic boron nitride growth busing UV-extended real-time spectroscopic ellipsometry: Effect of plasma additions and dynamic substrate bias steps Zapien JA, Collins RW, Messier R Journal of Vacuum Science & Technology A, 20(4), 1395, 2002 |
6 |
Recent progress in thin film growth analysis by multichannel spectroscopic ellipsometry Collins RW, Koh J, Fujiwara H, Rovira PI, Ferlauto AS, Zapien JA, Wronski CR, Messier R Applied Surface Science, 154, 217, 2000 |
7 |
Origin and evolution of sculptured thin films Messier R, Venugopal VC, Sunal PD Journal of Vacuum Science & Technology A, 18(4), 1538, 2000 |
8 |
Low-permittivity nanocomposite materials using sculptured thin film technology Venugopal VC, Lakhtakia A, Messier R, Kucera JP Journal of Vacuum Science & Technology B, 18(1), 32, 2000 |
9 |
Real-time spectroscopic ellipsometry from 1.5 to 6.5 eV Zapien JA, Collins RW, Messier R Thin Solid Films, 364(1-2), 16, 2000 |
10 |
Control of the preferred orientation of AlN thin films by collimated sputtering Rodriguez-Navarro A, Otano-Rivera W, Pilione LJ, Messier R, Garcia-Ruiz JM Journal of Vacuum Science & Technology A, 16(3), 1244, 1998 |