검색결과 : 11건
| No. | Article |
|---|---|
| 1 |
An O-2(+) probe energy study for boron quantification in Si1-xGex (0 <= x <= 1) using secondary ion mass spectrometry Morris RJH Applied Surface Science, 390, 778, 2016 |
| 2 |
Comparison of electron-phonon and hole-phonon energy loss rates in silicon Richardson-Bullock JS, Prest MJ, Shah VA, Gunnarsson D, Prunnila M, Dobbie A, Myronov M, Morris RJH, Whall TE, Parker EHC, Leadley DR Solid-State Electronics, 103, 40, 2015 |
| 3 |
Low energy SIMS characterization of passive oxide films formed on a low-nickel stainless steel in alkaline media. Fajardo S, Bastidas DM, Ryan MP, Criado M, McPhail DS, Morris RJH, Bastidas JM Applied Surface Science, 288, 423, 2014 |
| 4 |
Ultra high hole mobilities in a pure strained Ge quantum well Mironov OA, Hassan AHA, Morris RJH, Dobbie A, Uhlarz M, Chrastina D, Hague JP, Kiatgamolchai S, Beanland R, Gabani S, Berkutovh IB, Helmi M, Drachenko O, Myronov M, Leadley DR Thin Solid Films, 557, 329, 2014 |
| 5 |
Thermal Stability of Thin Compressively Strained Ge Surface Channels Grown on Relaxed Si0.2Ge0.8 Reverse-Graded Buffers Dobbie A, Nguyen VH, Morris RJH, Liu XC, Myronov M, Leadley DR Journal of the Electrochemical Society, 159(5), H490, 2012 |
| 6 |
Oxygen surface exchange and diffusion studies of La2Mo2O9 in different exchange atmospheres Liu J, Chater RJ, Morris RJH, Skinner SJ Solid State Ionics, 189(1), 39, 2011 |
| 7 |
Anomalous Oxidation States in Multilayers for Fuel Cell Applications Perkins JM, Fearn S, Cook SN, Srinivasan R, Rouleau CM, Christen HM, West GD, Morris RJH, Fraser HL, Skinner SJ, Kilner JA, McComb DW Advanced Functional Materials, 20(16), 2664, 2010 |
| 8 |
Surface enhancement of oxygen exchange and diffusion in the ionic conductor La2Mo2O9 Liu J, Chater RJ, Hagenhoff B, Morris RJH, Skinner SJ Solid State Ionics, 181(17-18), 812, 2010 |
| 9 |
Sodium and hydrogen analysis of room temperature glass corrosion using low energy CsSIMS Fearn S, McPhail DS, Morris RJH, Dowsett MG Applied Surface Science, 252(19), 7070, 2006 |
| 10 |
Different optical conductivity enhancement (OCE) protocols to eliminate charging during ultra low energy SIMS profiling of semiconductor and semi-insulating materials Morris RJH, Dowsett MG, Chang RJH Applied Surface Science, 252(19), 7221, 2006 |