검색결과 : 17건
| No. | Article |
|---|---|
| 1 |
Determination of gold nanoparticle shape from absorption spectroscopy and ellipsometry Battie Y, Izquierdo-Lorenzo I, Resano-Garcia A, Naciri AE, Akil S, Adam PM, Jradi S Applied Surface Science, 421, 301, 2017 |
| 2 |
An original method to determine complex refractive index of liquids by spectroscopic ellipsometry and illustrated applications Stchakovsky M, Battie Y, Naciri AE Applied Surface Science, 421, 802, 2017 |
| 3 |
Ellipsometry of Colloidal Solutions: New Experimental Setup and Application to Metallic Colloids Battie Y, Stchakovsky M, Naciri AE, Akil S, Chaoui N, Broch L Langmuir, 33(30), 7425, 2017 |
| 4 |
Effects of silicon porosity on physical properties of ZnO films Bouzouraa MB, Naciri AE, Moadhen A, Rinnert H, Guendouz M, Battie Y, Chaillou A, Zaibi MA, Oueslati M Materials Chemistry and Physics, 175, 233, 2016 |
| 5 |
Confinement in single walled carbon nanotubes investigated by spectroscopic ellipsometry Battie Y, Jamon D, Lauret JS, Gu Q, Gicquel-Guezo M, Naciri AE, Loiseau A Thin Solid Films, 571, 395, 2014 |
| 6 |
Design of a real-time spectroscopic rotating compensator ellipsometer without systematic errors Broch L, Stein N, Zimmer A, Battie Y, Naciri AE Thin Solid Films, 571, 509, 2014 |
| 7 |
Theory of dual-rotating polarizer and analyzer ellipsometer Gilliot M, Naciri AE Thin Solid Films, 540, 46, 2013 |
| 8 |
Blue-violet boron-based Distributed Bragg Reflectors for VCSEL application Abid M, Moudakir T, Djebbour Z, Orsal G, Gautier S, Naciri AE, Migan-Dubois A, Ougazzaden A Journal of Crystal Growth, 315(1), 283, 2011 |
| 9 |
Analysis of systematic errors in Mueller matrix ellipsometry as a function of the retardance of the dual rotating compensators Broch L, Naciri AE, Johann L Thin Solid Films, 519(9), 2601, 2011 |
| 10 |
Optical properties of ZnTe and ZnS nanocrystals by critical-points and Tauc-Lorentz models Naciri AE, Ahmed F, Stchakovsky M Thin Solid Films, 519(9), 2843, 2011 |