검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Two-dimensional imaging of charge carrier profiles using local metal-semiconductor capacitance-voltage measurement Li Y, Nxumalo JN, Thomson DJ Journal of Vacuum Science & Technology B, 16(1), 457, 1998 |
| 2 |
Cross-Sectional Imaging of Semiconductor-Device Structures by Scanning Resistance Microscopy Nxumalo JN, Shimizu DT, Thomson DJ Journal of Vacuum Science & Technology B, 14(1), 386, 1996 |