화학공학소재연구정보센터
검색결과 : 17건
No. Article
1 Characterization of Gaseous Plasma Sustained in Mixtures of HMDSO and O-2 in an Industrial-Scale Reactor
Gosar Z, Kovac J, Mozetic M, Primc G, Vesel A, Zaplotnik R
Plasma Chemistry and Plasma Processing, 40(1), 25, 2020
2 Characteristics of a plasma information variable in phenomenology-based, statistically-tuned virtual metrology to predict silicon dioxide etching depth
Jang YC, Roh HJ, Park S, Jeong S, Ryu S, Kwon JW, Kim NK, Kim GH
Current Applied Physics, 19(10), 1068, 2019
3 Rotating Gliding Arc Assisted Water Splitting in Atmospheric Nitrogen
Zhang H, Zhu FS, Li XD, Cen KF, Du CM, Tu X
Plasma Chemistry and Plasma Processing, 36(3), 813, 2016
4 Moisture Removal from Natural Jute Fibre by Plasma Drying Process
Morshed MM, Alam MM, Daniels SM
Plasma Chemistry and Plasma Processing, 32(2), 249, 2012
5 Introduction of Primary Amino Groups on Poly(ethylene terephthalate) Surfaces by Ammonia and a Mix of Nitrogen and Hydrogen Plasma
Casimiro J, Lepoittevin B, Boisse-Laporte C, Barthes-Labrousse MG, Jegou P, Brisset F, Roger P
Plasma Chemistry and Plasma Processing, 32(2), 305, 2012
6 Measurement of extreme ultraviolet light and electron temperature for a dense plasmas from hypocycloidal pinch device
Hong YJ, Lee SH, Uhm HS, Choi EH
Current Applied Physics, 11(5), S177, 2011
7 In-Line Investigations of Atmospheric Pressure Plasma Processes in Correlation with Surface Analysis
Gunther S, Teuscher N, Heilmann A, Hansel R, Voigt HM, Kiesow A
Journal of Adhesion Science and Technology, 25(8), 857, 2011
8 Effects of UV photon irradiation on SiOx (0 < x < 2) structural properties
Tomozeiu N
Applied Surface Science, 253(1), 376, 2006
9 Optical emission spectroscopy during fabrication of indium-tin-oxynitride films by RF-sputtering
Koufaki M, Sifakis M, Iliopoulos E, Pelekanos N, Modreanu A, Cimalla V, Ecke G, Aperathitis E
Applied Surface Science, 253(1), 405, 2006
10 Growth and microstructures of carbon nanotube films prepared by microwave plasma enhanced chemical vapor deposition process
Srivastava SK, Vankar VD, Kumar V
Thin Solid Films, 515(4), 1552, 2006