검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Investigation of the dependence of phosphorus segregation on grain boundary structure in Fe-P-C alloy:.ross comparison between Atom Probe Tomography and Auger Electron Spectroscopy Akhatova A, Christien F, Barnier V, Radiguet B, Cadel E, Cuvilly F, Pareige P Applied Surface Science, 463, 203, 2019 |
| 2 |
The chemical composition changes of silicon and phosphorus in the process of native oxide formation of heavily phosphorus doped silicon Ying WB, Mizokawa Y, Kamiura Y, Kawamoto K, Yang WY Applied Surface Science, 181(1-2), 1, 2001 |
| 3 |
Dopant dose loss at the Si-SiO2 interface Vuong HH, Rafferty CS, Eshraghi SA, Ning J, McMacken JR, Chaudhry S, McKinley J, Stevie FA Journal of Vacuum Science & Technology B, 18(1), 428, 2000 |