| 1 |
Practical expressions for the mean escape depth, the information depth, and the effective attenuation length in Auger-electron spectroscopy and x-ray photoelectron spectroscopy
Jablonski A, Powell CJ
Journal of Vacuum Science & Technology A, 27(2), 253, 2009 |
| 2 |
Evaluation of the shapes of Auger- and secondary-electron line scans across interfaces with the logistic function
Wight SA, Powell CJ
Journal of Vacuum Science & Technology A, 24(4), 1024, 2006 |
| 3 |
Soft magnetic layers for low-field-detection magnetic sensors
Egelhoff WF, McMichael RD, Dennis CL, Stiles MD, Johnson F, Shapiro AJ, Maranville BB, Powell CJ
Thin Solid Films, 505(1-2), 90, 2006 |
| 4 |
Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy
Powell CJ, Jablonski A, Werner WSM, Smekal W
Applied Surface Science, 239(3-4), 470, 2005 |
| 5 |
Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy (vol 239, pg 470, 2005)
Powell CJ, Jablonski A, Werner WSM, Smekal W
Applied Surface Science, 242(3-4), 219, 2005 |
| 6 |
Monte Carlo simulations of electron transport in solids: applications to electron backscattering from surfaces
Jablonski A, Powell CJ
Applied Surface Science, 242(3-4), 220, 2005 |
| 7 |
Effect of backscattered electrons on the analysis area in scanning Auger microscopy
Powell CJ
Applied Surface Science, 230(1-4), 327, 2004 |
| 8 |
Information depth and the mean escape depth in Auger electron spectroscopy and X-ray photoelectron spectroscopy
Jablonski A, Powell CJ
Journal of Vacuum Science & Technology A, 21(1), 274, 2003 |
| 9 |
Growth and trends in Auger-electron spectroscopy and x-ray photoelectron spectroscopy for surface analysis
Powell CJ
Journal of Vacuum Science & Technology A, 21(5S), S42, 2003 |
| 10 |
Ultra-thin aluminum oxide as a thermal oxidation barrier on metal films
Gan L, Gomez RD, Castillo A, Chen PJ, Powell CJ, Egelhoff WF
Thin Solid Films, 415(1-2), 219, 2002 |
