검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Analysis of the optical properties and structure of sculptured thin films from spectroscopic Mueller matrix ellipsometry Podraza NJ, Chen C, An I, Ferreira GM, Rovira PI, Messier R, Collins RW Thin Solid Films, 455-56, 571, 2004 |
| 2 |
Recent progress in thin film growth analysis by multichannel spectroscopic ellipsometry Collins RW, Koh J, Fujiwara H, Rovira PI, Ferlauto AS, Zapien JA, Wronski CR, Messier R Applied Surface Science, 154, 217, 2000 |
| 3 |
Real time analysis of amorphous and microcrystalline silicon film growth by multichannel ellipsometry Collins RW, Koh J, Ferlauto AS, Rovira PI, Lee YH, Koval RJ, Wronski CR Thin Solid Films, 364(1-2), 129, 2000 |
| 4 |
Advances in multichannel spectroscopic ellipsometry Collins RW, An I, Fujiwara H, Lee JC, Lu YW, Koh JY, Rovira PI Thin Solid Films, 313-314, 18, 1998 |
| 5 |
Rotating-compensator multichannel transmission ellipsometry of a thin-film helicoidal bianisotropic medium Rovira PI, Yarussi RA, Collins RW, Venugopal VC, Lakhtakia A, Messier R, Robbie K, Brett MJ Thin Solid Films, 313-314, 373, 1998 |