검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Poole-Frenkel emission and defect density in a-Si:H/nc-Si:H multilayer films for "all silicon" third generation photovoltaics Kherodia A, Panchal AK Thin Solid Films, 654, 16, 2018 |
| 2 |
A technique for the fabrication of various multiparametric porous silicon samples on a single substrate Park SH, Lee KW, Kim YY Thin Solid Films, 518(10), 2860, 2010 |
| 3 |
Nanostructuring of Mo/Si multilayers by means of reactive ion etching using a three-level mask Dreeskornfeld L, Haindl G, Kleineberg U, Heinzmann U, Shi F, Volland B, Rangelow IW, Majkova E, Luby S, Kostic, Matay L, Hrkut P, Hudek P, Lee HY Thin Solid Films, 458(1-2), 227, 2004 |
| 4 |
Evaluation of SIMS depth resolution using delta-doped multilayers and mixing-roughness-information depth model Takano A, Homma Y, Higashi Y, Takenaka H, Hayashi S, Goto K, Inoue M, Shimizu R Applied Surface Science, 203, 294, 2003 |
| 5 |
Silicidation in chromium-amorphous silicon multilayer films Bouabellou A, Halimi R, Mirouh K, Labbani R, Djebien R, Mosser A Thin Solid Films, 383(1-2), 296, 2001 |
| 6 |
Characterization of Obliquely Deposited Tungsten/Silicon Multilayers Majkova E, Luby S, Jergel M, Senderak R, George B, Vaezzadeh M, Ghanbaja J Thin Solid Films, 238(2), 295, 1994 |