검색결과 : 18건
| No. | Article |
|---|---|
| 1 |
Imaging charge carriers in potential-induced degradation defects of c-Si solar cells by scanning capacitance microscopy Jiang CS, Xiao C, Moutinho HR, Johnston S, Al-Jassim MM, Yang X, Chen Y, Ye J Solar Energy, 162, 330, 2018 |
| 2 |
Electrical current at micro-/macro-scale of undoped an nitrogen-doped MWPECVD diamond films Cicala G, Velardi L, Senesi GS, Picca RA, Cioffi N Applied Surface Science, 426, 456, 2017 |
| 3 |
Measurement of 3-dimensional dopant distribution in InGaAs microdiscs grown selectively on Si (111) Watanabe T, Takeuchi M, Nakano Y, Sugiyama M Journal of Crystal Growth, 464, 33, 2017 |
| 4 |
Mesoscopic impedance analysis of solid materials' surface Darowicki K, Zielinski A Electrochimica Acta, 55(26), 7761, 2010 |
| 5 |
A review of advanced scanning probe microscope analysis of functional films and semiconductor devices Benstetter G, Biberger R, Liu DP Thin Solid Films, 517(17), 5100, 2009 |
| 6 |
Interpretation of scanning capacitance microscopy for thin oxides characterization Ligor O, Gautier B, Descamps-Mandine A, Albertini D, Baboux N, Militaru L Thin Solid Films, 517(24), 6721, 2009 |
| 7 |
Comparison of scanning capacitance microscopy measurements in open and closed loop modes on highly doped silicon monolayers Goghero D, Gautier B, Descamps A, Bremond G, Faucher M, Mariolle D, Bertin F Solid-State Electronics, 50(9-10), 1479, 2006 |
| 8 |
Charge storage in silicon-implanted silicondioxide layers examined by scanning probe microscopy Beyer R, Beyreuther E, von Borany J, Weber J Thin Solid Films, 513(1-2), 159, 2006 |
| 9 |
Scanning capacitance microscopy investigations of lnGaAs/InP quantum wells Douheret O, Maknys K, Anand S Thin Solid Films, 459(1-2), 67, 2004 |
| 10 |
Quantitative high-resolution two-dimensional profiling of SiC by scanning capacitance microscopy Raineri V, Giannazzo F, Calcagno L, Musumeci P, Roccaforte F, La Via F Materials Science Forum, 389-3, 655, 2002 |