검색결과 : 1건
No. | Article |
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1 |
The Effect of High-Temperature Anneal on Electrical Stress-Generated Defects in Metal-Oxide-Semiconductor Structures Berger M, Schwartsglass O, Shappir J Journal of the Electrochemical Society, 141(8), 2140, 1994 |
No. | Article |
---|---|
1 |
The Effect of High-Temperature Anneal on Electrical Stress-Generated Defects in Metal-Oxide-Semiconductor Structures Berger M, Schwartsglass O, Shappir J Journal of the Electrochemical Society, 141(8), 2140, 1994 |