검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Cross-Sectional Imaging of Semiconductor-Device Structures by Scanning Resistance Microscopy Nxumalo JN, Shimizu DT, Thomson DJ Journal of Vacuum Science & Technology B, 14(1), 386, 1996 |
| No. | Article |
|---|---|
| 1 |
Cross-Sectional Imaging of Semiconductor-Device Structures by Scanning Resistance Microscopy Nxumalo JN, Shimizu DT, Thomson DJ Journal of Vacuum Science & Technology B, 14(1), 386, 1996 |